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2019-07-30 23:17:36
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논문명(제목만) Detection of the Interface-Trap Charge Density and Lateral Nonuniformity of Through-Silicon Vias 
논문명 Kibeom Kim, Jangyong Ahn, and Seungyoung Ahn, “Detection of the Interface Trap Charge Density and Lateral Nonuniformity of Through-Silicon Vias,” IEEE Microwave and Wireless Components Letters, vol. 28, no. 5, pp. 422-424, May. 2018. 
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