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2019-05-21 18:33:15
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논문명(제목만) E-field Induced Keep-Out Zone Determination Method of Through-Silicon Vias for 3-D ICs 
논문명 Kibeom Kim, Junsung Choi, Seongho Woo, Jaeyong Cho, and Seungyoung Ahn, "E-field Induced Keep-Out Zone Determination Method of Through-Silicon Vias for 3-D ICs," Microelectronics reliability, July. 2019. 
순번 73 

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