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2018-07-10 23:19:55
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논문명(제목만) A Two-Line Time-Domain Gating Method for Characterization of Test Fixture With via Hole Discontinuity 
논문명 Jaeyong Cho, Byung-Sung Kim, Jonghyuck Jung, Joonsung Kim, Kibeom Kim, Karam Hwang, Hwiseob Lee, Seungil Jeung and Seungyoung Ahn, “A Two-line Time-domain Gating Method for Characterization of Test Fixture with Via-hole Discontinuity,” IEEE Microwave and Wireless Components Letters, Vol. No. 10, pp. 936-938, Oct. 2017. 
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